源の測定の単位

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半導体の電気特性試験 SMUユニット S100 DC 30V 1A SMU測定

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:Semiconductor Electrical Characteristics Testing SMU Unit, DC S100 SMU Unit, S100 30V 1A SMU Measurement

Semiconductor Electrical Characteristics Testing SMU Unit S100 DC 30V 1A SMU Measurement The S100 Source Measure Unit, meticulously crafted by PRECISE INSTRUMENT, is an outstanding representative of domestic testing equipment. It breaks the long-standing monopoly of foreign technology and delivers a... もっと見る

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2チャネルソースメーター

(3)

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30V 30A ダブルチャネル ソース メーター 単位 DP100B 電圧/電流測定

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:30V 30A Dual Channel Source Meter, DP100B Source Meter Unit, Voltage Current SMU unit

30V 30A Dual Channel Source Meter Unit DP100B With Voltage / Current Measurement The DP100B dual channel high precision desktop pulse source measure unit is the newly developed high precision, large dynamic, digital touch source measure unit that based on the single channel pulse desktop source meas... もっと見る

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多チャンネル試験装置

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18V 1A 4チャネルサブカード パルス源測定ユニット CBI403 SMU 測定

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:18V 1A Four Channel Source Measure, Sub Card Pulse Source Measure Unit, CBI403 SMU Measurement

18V 1A Four Channel Sub Card Pulse Source Measure Unit CBI403 SMU Measurement The CBI401 modular subcard is a member of the CS Series Source Measure Unit (SMU) family, designed for high-precision, high-dynamic-range electrical characterization. Its modular architecture allows flexible integration wi... もっと見る

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高電流電源

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300A 30V パルス電源 高電流源 HCPL030 SiC IGBT GaN HEMT 試験用

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:300A 30V Pulse Power Supply, 300A 30V High Current Source, HEMT Test Pulse Power Supply

300A 30V Pulse Power Supply High Current Source HCPL030 For SiC IGBT GaN HEMT Test The HCPL030 series high - current pulse power supply is a pulse constant - current source. The product features steep output pulse edges (10μs), high testing efficiency (40ms, with external control relay), support for... もっと見る

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高電圧電源

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1200V 100mA IGBT故障電圧試験用高電圧電源測定単位

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:High Voltage Power Source Measure Unit, 1200V 100mA High Voltage Power Source, IGBT Breakdown High Voltage Power Source

1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test The E100 is a high-performance high voltage source measure unit specifically designed for high voltage testing environments. It can output and measure voltages up to 1200V, and accurately measure weak current signals as low as 1nA... もっと見る

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レーザー電源の試験

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20A CW / 20A QCW テストレーザー電源 HCPL002 高電力ダイオードレーザー電源

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:20A QCW Testing Laser Power Supply, 20A CW Testing Laser Power Supply, HCPL002 Diode Laser Power Supply

20A CW / 20A QCW Testing Laser Power Supply HCPL002 High Power Diode Laser Power Supply HCPL002 is a high-power laser test power supply designed to meet the most demanding test needs with advanced technology. It has CW and QCW output capabilities, and the CW and QCW currents can reach up to 20A, pro... もっと見る

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データ取得カード

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1MS/S A400 データ取得カード 4チャネル 16ビット ADC 解像度 Daq カード

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:A400 Data Acquisition Card, 16 Bit ADC Resolution Daq Card, 4 Channels Data Acquisition Card

1MS/S A400 Data Acquisition Card 4 Channels 16 Bit ADC Resolution Daq Card A400 data acquisition card is a plug-in card type independently designed and developed by Psysi, which supports variable rate sampling and large-capacity data storage, with 4 channels in a single card and up to 40 channels in... もっと見る

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半導体試験システム

(5)

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LDBIレーザー老化半導体試験システム 多チャンネル試験システム

価格: Negotiable

MOQ: 1 unit

納期: 2-8 weeks

ブランド: PRECISE INSTRUMENT

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ハイライト:Laser Aging Semiconductor Test Systems, LDBI Semiconductor Test Systems, Multi Channel Power Device Analyzer

LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and ag... もっと見る

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