半導体試験システム
(5)
LDBIレーザー老化半導体試験システム 多チャンネル試験システム
価格: Negotiable
MOQ: 1 unit
納期: 2-8 weeks
ブランド: PRECISE INSTRUMENT
ハイライト:Laser Aging Semiconductor Test Systems, LDBI Semiconductor Test Systems, Multi Channel Power Device Analyzer
LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and ag... もっと見る
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1200V/100A 半導体パラメータ分析器 SPA6100 半導体試験システム
価格: Negotiable
MOQ: 1 unit
納期: 2-8 weeks
ブランド: PRECISE INSTRUMENT
ハイライト:1200V/100A Semiconductor Parameter Analyzer, SPA6100 Semiconductor Test Systems, SPA6100 Semiconductor Parameter Analyzer
1200V/100A Semiconductor Parameter Analyzer SPA6100 Semiconductor Test Systems The SPA6100 Semiconductor Parameter Analyzer offers advantages including high precision, wide measurement range, rapid flexibility, and strong compatibility. This product supports simultaneous testing of DC current-voltag... もっと見る
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10kV/6000A 電源装置分析器 モスフェット BJT IGBT SiC GaN半導体のための静的試験 PMST
価格: Negotiable
MOQ: 1 unit
納期: 2-8 weeks
ブランド: PRECISE INSTRUMENT
ハイライト:10kV/6000A Power Device Analyzer, Analyzer Static Test PMST, BJT IGBT Power Device Analyzer
10kV/6000A Power Device Analyzer Static Test PMST For MOSFET BJT IGBT And SiC GaN Semiconductors PMST Static Parameter Test System for Power Devices integrates multiple measurement and analysis functions, enabling precise testing of static parameters for various power devices (e.g., MOSFETs, BJTs, I... もっと見る
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10Hz-1MHz半導体装置のC-V試験システム
価格: Negotiable
MOQ: 1 unit
納期: 2-8 weeks
ブランド: PRECISE INSTRUMENT
ハイライト:1MHz Semiconductor Power Device, 10Hz Semiconductor Power Device, C-V Semiconductor Characterization System
10Hz-1MHz Semiconductor Device C-V Testing System Capacitance-Voltage (C-V) Measurement is widely used to characterize semiconductor parameters, particularly in MOS capacitors (MOS CAPs) and MOSFET structures. The capacitance of a metal-oxide-semiconductor (MOS) structure is a function of the applie... もっと見る
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1000A 電流センサー試験システム CTMS 半導体試験装置
価格: Negotiable
MOQ: 1 unit
納期: 2-8 weeks
ブランド: PRECISE INSTRUMENT
ハイライト:1000A Current Sensor Test System, CTMS Semiconductor Testing Equipment, 1000A CTMS Semiconductor Testing
1000A Current Sensor Test System CTMS Semiconductor Testing Equipment CTMS test system integrates a variety of measurement and analysis functions, and can accurately measure the static and dynamic parameters of various current sensors (Hall current sensors, Rogowski coils, Pilsner coils, etc.), with... もっと見る
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